There are several solutions to increase the reliability of safety-critical embedded systems (e.g. redundant systems). Where appropriate, achieving the highest possible reliability is always an important goal. The present article also aims to describe a solution for this purpose. One of these reliability enhancement options - besides redundancy - is the development of a self-testing system that can detect any malfunctions in downtime (during inactivity) or during normal operation. If there is no error, then this self-testing system reports that the system is error-free. The self-testing and event logging system described in this article provides an additional advantage over other solutions. In addition to increased reliability, the root causes of the stored events and information can be discovered and eliminated in case of an error, even, if necessary, by hardware or software changes. The system outlined in this article - of course - requires further considerations and additions, and the details of circuit and software implementation should be elaborated, but its use in safety-critical systems is clearly beneficial.

KEY WORDS
safety-critical embedded system, self-test, operation and event logging, enhancing reliability, smart city

CLASSIFICATION

ACM:	10010583.10010737.10010744.10010741
JEL:	D81